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arXiv quant-ph/0505003quant-phcond-mat.mtrl-sci

Investigation of the Casimir force between metal and semiconductor test bodies

F. Chen, U. Mohideen, G. L. Klimchitskaya, V. M. Mostepanenko

英文摘要:

The measurement of the Casimir force between a large gold coated sphere and single crystal silicon plate is performed with an atomic force microscope. A rigorous statistical comparison of data with theory is done, without use of the concept of root-mean-square deviation, and excellent agreement is obtained. The Casimir force between metal and semiconductor is demonstrated to be significantly different than between two similar or dissimilar metals.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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