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arXiv quant-ph/9906033quant-ph
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最近Casimir力测量的完全粗糙度和电导率修正

Complete roughness and conductivity corrections for the recent Casimir force measurement

G. L. Klimchitskaya, Anushree Roy, U. Mohideen, V. M. Mostepanenko

摘要:

我们认为详细的粗糙度和电导率修正的卡西米尔力在最近的卡西米尔力测量采用原子力显微镜。分别用原子力显微镜和扫描电子显微镜研究了金属板和球体的粗糙度。它由不同高度的独立晶体和随机背景组成。确定相对于零粗糙度水平的粗糙度幅度,并计算Casimir力的校正,直到小参数的四阶(其是该幅度除以两个测试体之间的距离)。此外,由于有限的电导率的修正被发现到四阶的电磁零点振荡到金属的相对穿透深度。考虑这两种修正后的平板上方球体的理论结果与实测的Casimir力非常吻合。

英文摘要:

We consider detailed roughness and conductivity corrections to the Casimir force in the recent Casimir force measurement employing an Atomic Force Microscope. The roughness of the test bodies-a metal plate and a sphere- was investigated with the Atomic Force Microscope and the Scanning Electron Microscope respectively. It consists of separate crystals of different heights and a stochastic background. The amplitude of roughness relative to the zero roughness level was determined and the corrections to the Casimir force were calculated up to the fourth order in a small parameter (which is this amplitude divided by the distance between the two test bodies). Also the corrections due to finite conductivity were found up to the fourth order in relative penetration depth of electromagnetic zero point oscillations into the metal. The theoretical result for the configuration of a sphere above a plate taking into account both corrections is in excellent agreement with the measured Casimir force.

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