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arXiv 2603.18547physics.ins-det
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4H-SiC PIN二极管在X射线照射下的电荷收集效率和时间分辨率稳定性研究

Stability of Charge Collection Efficiency and Time Resolution in 4H-SiC PIN Diodes Under X-ray Irradiation

Jilin University(吉林大学);Institute of High Energy Physics, Chinese Academy of Sciences(中国科学院高能物理研究所)

Jiaqi Zhou, Sen Zhao, Xiyuan Zhang, Suyu Xiao, Chenxi Fu, Congcong Wang, Yanpeng Li, Weimin Song, Xin Shi

AI总结:

本文研究了4H-SiC PIN探测器在X射线照射下的辐射耐受性,发现其电荷收集效率和时间分辨率在2 MGy照射后仍保持稳定,适用于高能物理、航天和核反应堆监测。

摘要:

本文研究了在X射线照射下4H-SiC PIN二极管的电荷收集效率和时间分辨率的稳定性。研究发现,该探测器在2 MGy照射后,反向漏电流仍保持在极低水平,电容-电压特性基本一致,电荷收集效率对β粒子的下降小于5%,时间分辨率保持良好, jitter有所增加。这些结果表明,在极端X射线暴露下探测器性能稳定,显示出在高能物理、航天任务和核反应堆监测中的应用潜力。

英文摘要:

This study evaluates the radiation tolerance of a 4H-SiC PIN detector under X-ray irradiation up to \SI{2}{MGy} (Si) at \SI{160}{keV}. The detector features a fully epitaxial vertical PIN structure with mesa terminations and field plates. Comprehensive pre- and post-irradiation characterization includes I-V/C-V measurements, charge collection efficiency (CCE) and timing resolution tests using $β$-particles ($^{90}$Sr). After \SI{2}{MGy} irradiation, the reverse leakage current remains at an ultralow level of $\sim 10^{-11}$ \si{A/cm^2} at \SI{-300}{V} with negligible degradation. C-V characteristics are basically consistent, with full depletion at \SI{~130}{V}. CCE for $β$-particles decreases by less than 5\%. The detector maintains good timing resolution: \SI{21}{ps} before and \SI{31}{ps} after irradiation, with jitter increasing moderately. These results demonstrate stable performance under extreme X-ray exposure, highlighting the detector's potential for radiation-hard applications in high-energy physics, space missions, and nuclear reactor monitoring.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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