arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2403.06359cond-mat.mtrl-sciphysics.app-ph
收藏

介电与压电氧化物中的电学退化:缺陷化学及相关表征技术综述

Electrical Degradation in Dielectric and Piezoelectric Oxides: Review of Defect Chemistry and Associated Characterization Techniques

Pedram Yousefian, Betul Akkopru-Akgun, Clive A. Randall, Susan Trolier-McKinstry

AI总结:

本文综述了介电与压电氧化物中的电学退化问题,重点介绍了缺陷化学机制及分析缺陷与退化所需的光谱、显微和电子等关键表征技术。

摘要:

介电与压电氧化物的特性由其加工历史、晶体结构、化学成分、微观结构、掺杂剂(或缺陷)分布及缺陷动力学决定。这些材料在航空航天、医疗、军事、交通、电力工程和通信等众多应用中不可或缺,被用作陶瓷圆片、厚膜与薄膜、多层器件等。在理解这些材料的材料学、加工、性能和可靠性方面取得的重大进展,促使其在消费电子、军事和航空航天应用中得到广泛使用。本综述深入探讨了介电与压电材料中的电学退化,重点关注缺陷化学和关键表征技术。此外,还详细讨论了分析缺陷和退化机制所必需的各种光谱、显微和电子表征技术。

英文摘要:

The properties of dielectric and piezoelectric oxides are determined by their processing history, crystal structure, chemical composition, microstructure, dopants (or defect) distribution, and defect kinetics. These materials are essential in a diverse range of applications including aerospace, medical, military, transportation, power engineering, and communication, where they are used as ceramic discs, thick and thin films, multilayer devices, etc. Significant advances in understanding the materials, processing, properties, and reliability of these materials have led to their widespread use in consumer electronics, military, and aerospace applications. This review delves into electrical degradation in dielectrics and piezoelectrics, focusing on defect chemistry and key characterization techniques. It also provides a detailed discussion of various spectroscopic, microscopic, and electronic characterization techniques essential for analyzing defects and degradation mechanisms.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑