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arXiv 1906.02848physics.app-ph
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面向中红外成像应用的硅基GeSn光电探测器

Si-based GeSn photodetectors towards mid-infrared imaging applications

Huong Tran, Thach Pham, Joe Margetis, Yiyin Zhou, Wei Dou, Perry C. Grant, Joshua M. Grant, Sattar Alkabi, Greg Sun, Richard A. Soref, John Tolle, Yong-Hang Zha… 展开作者

Huong Tran, Thach Pham, Joe Margetis, Yiyin Zhou, Wei Dou, Perry C. Grant, Joshua M. Grant, Sattar Alkabi, Greg Sun, Richard A. Soref, John Tolle, Yong-Hang Zhang, Wei Du, Baohua Li, Mansour Mortazavi, Shui-Qing Yu

摘要:

本文报道了硅基GeSn中红外光电探测器的综合研究,其中包括:1)研制了一组Sn组分从10.5%到22.3%的光电导体,截止波长扩展到3.65 μ m。测得的最大D * 为1.1 × 10^10 cmHz ^(1/2)W(-1),与商用扩展InGaAs探测器相当; 2)在深入分析暗电流机理的基础上,发展了光电二极管表面钝化技术,有效降低了暗电流。此外,使用GeSn光电探测器获得中红外图像,显示出与使用商业PbSe探测器获得的图像质量相当的图像质量。

英文摘要:

This paper reports a comprehensive study of Si-based GeSn mid-infrared photodetectors, which includes: 1) the demonstration of a set of photoconductors with Sn compositions ranging from 10.5% to 22.3%, showing the cut-off wavelength has been extended to 3.65 um. The measured maximum D* of 1.1x10^10 cmHz^(1/2)W(-1) is comparable to that of commercial extended-InGaAs detectors; 2) the development of surface passivation technique on photodiode based on in-depth analysis of dark current mechanism, effectively reducing the dark current. Moreover, mid-infrared images were obtained using GeSn photodetectors, showing the comparable image quality with that acquired by using commercial PbSe detectors.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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