arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1812.01293cond-mat.mtrl-sci
收藏

用第一性原理计算重排列无机半导体带边的绝对参考能

Absolute Reference Energy to Realign the Band-edges of Inorganic Semiconductors Using First-principles Calculations

Tilak Das, Xavier Rocquefelte, Stèphane Jobic

摘要:

从第一性原理模拟到重新排列半导体的价带顶和导带底,找到绝对参考能量的挑战,提出了一种基于平面波计算的理论方法,如在最先进的密度泛函理论内实现的。我们已经研究了一些无机二元半导体,包括氧化物和非氧化物,例如金红石和金红石TiO 2,纤锌矿ZnO,金红石SnO 2,GaP,GaAs,InP,ZnTe,CdS,CdSe和SiC的非晶相,这些是众所周知的,对于光电化学,光电子器件应用在其独立和/或异质结构形态中是定性重要的。这些众所周知的半导体的计算的带边相对于我们提出的绝对真空参考能量,这是定义与我们提出的修正,并比较其现有的实验值从平带测量重新调整。预测是合理的,以及与已知的实验平带测量数据一致。我们估计的这组11种化合物的平均绝对误差为~ 0.17 eV,更接近已知的实验极限0.10-0.20 eV。

英文摘要:

The challenge of finding an absolute reference energy from first-principles simulations to realigning semiconductor's valence band-top and conduction band-bottom, a theoretical methodology is proposed based on plane-wave calculations as implemented within state-of-art density functional theory. We have studied some of inorganic binary semiconductors, including both oxides and non-oxides, as for example rutile- and anatase TiO2, wurtzite ZnO, rutile SnO2, blende phase of GaP, GaAs, InP, ZnTe, CdS, CdSe, and SiC, those are well known and qualitatively important for photoelectrochemical, optoelectronic device applications in their standalone and/or heterostructure morphologies. The calculated band-edges of these well known semiconductors are realigned with respect to our proposed absolute vacuum reference energy, which is defined with our proposed corrections and compared to their available experimental values from flat-band measurement. The prediction is reasonably well agreed with known experimental flat-band measured data. Our estimated mean absolute error bar for these set of eleven compounds is ~ 0.17 eV, closer to the known experimental limit 0.10-0.20 eV.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑