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arXiv 1003.2233cond-mat.str-el
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沿着拓扑绝缘体Bi $_2$ Te $_3$表面上的台阶的束缚态的STM成像

STM imaging of a bound state along a step on the surface of the topological insulator Bi$_2$Te$_3$

Zhanybek Alpichshev, J. G. Analytis, J. -H. Chu, I. R. Fisher, A. Kapitulnik

摘要:

详细研究了强拓扑绝缘体Bi_2Te_3台阶边缘附近的表面态带的LDOS,发现了一个一维束缚态,它与台阶边缘平行,并在一定的特征距离处与台阶边缘束缚。这种束缚态在体隙区域中被清楚地观察到,而它在高能量下与翘曲表面带的振荡以及与狄拉克点附近的价带态纠缠。利用Zhang等人提出的全有效哈密顿量,我们得到了一个封闭的公式,这个束缚态,适合的数据,并提供进一步的洞察到一般的拓扑性质的表面带附近的强结构缺陷的电子结构。

英文摘要:

Detailed study of the LDOS associated with the surface-state-band near a step-edge of the strong topological-insulator Bi2Te3, reveal a one-dimensional bound state that runs parallel to the stepedge and is bound to it at some characteristic distance. This bound state is clearly observed in the bulk gap region, while it becomes entangled with the oscillations of the warped surface band at high energy, and with the valence band states near the Dirac point. Using the full effective Hamiltonian proposed by Zhang et al., we obtain a closed formula for this bound state that fits the data and provide further insight into the general topological properties of the electronic structure of the surface band near strong structural defects.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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