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arXiv 0910.4338nucl-ex
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97 Ru电子俘获衰变的Half-life:精密测量显示无温度依赖性

Half-life of the electron-capture decay of 97Ru: Precision measurement shows no temperature dependence

J. R. Goodwin, V. V. Golovko, V. E. Iacob, J. C. Hardy

摘要:

我们测量了~(97)Ru在金属环境中的电子俘获(ec)衰变半衰期,包括低温(19 K)和室温。我们发现两种温度下的半衰期相同,在0.1%以内。这表明,最近声称在类似情况下,7 Be的EC衰变半衰期变化为0.9%+/- 0.2%,当然不能推广到其他EC衰变。我们的结果为97 Ru的半衰期,2.8370(14)d在室温和2.8382(14)d在19 K,是一致的,但更精确,比以前的室温测量。此外,我们还测量了β发射体103 Ru和105 Rh在两种温度下的半衰期,发现它们也没有变化。

英文摘要:

We have measured the half-life of the electron-capture (ec) decay of 97Ru in a metallic environment, both at low temperature (19K), and also at room temperature. We find the half-lives at both temperatures to be the same within 0.1%. This demonstrates that a recent claim that the ec decay half-life for 7Be changes by $0.9% +/- 0.2% under similar circumstances certainly cannot be generalized to other ec decays. Our results for the half-life of 97Ru, 2.8370(14)d at room temperature and 2.8382(14)d at 19K, are consistent with, but much more precise than, previous room-temperature measurements. In addition, we have also measured the half-lives of the beta-emitters 103Ru and 105Rh at both temperatures, and found them also to be unchanged.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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