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arXiv 0901.0485cond-mat.mes-hallcond-mat.mtrl-sci
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石墨烯基器件中的接触电阻

Contact resistance in graphene-based devices

S. Russo, M. F. Craciun, M. Yamamoto, A. F. Morpurgo, S. Tarucha

摘要:

我们报告了一个系统的研究接触电阻存在于金属(Ti)和石墨烯层之间的界面上的不同,已知的厚度。通过比较在11个石墨烯薄片上制造的器件,我们证明了单层、双层和三层石墨烯($\sim800 \pm 200 Ωμm$)的接触电阻在数量上是相同的,并且在所有情况下都与栅极电压和温度无关。我们认为,所观察到的行为是由于从金属的电荷转移,导致费米能级在接触下的石墨烯区域远离电荷中性点。

英文摘要:

We report a systematic study of the contact resistance present at the interface between a metal (Ti) and graphene layers of different, known thickness. By comparing devices fabricated on 11 graphene flakes we demonstrate that the contact resistance is quantitatively the same for single-, bi-, and tri-layer graphene ($\sim800 \pm 200 Ωμm$), and is in all cases independent of gate voltage and temperature. We argue that the observed behavior is due to charge transfer from the metal, causing the Fermi level in the graphene region under the contacts to shift far away from the charge neutrality point.

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