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arXiv 0909.1220cond-mat.mes-hall
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基于外延石墨烯的量子电阻标准

Quantum Resistance Standard Based on Epitaxial Graphene

Alexander Tzalenchuk, Samuel Lara-Avila, Alexei Kalaboukhov, Sara Paolillo, Mikael Syväjärvi, Rositza Yakimova, Olga Kazakova, T. J. B. M. Janssen, Vladimir Fal'ko, Sergey Kubatkin

摘要:

我们报告了一个量子霍尔电阻标准的发展,在300 mK精确到十亿分之几,并基于大面积外延石墨烯。显著的精度构成了在剥离的石墨烯中获得的最佳结果的四个数量级的改进,并且与在完善的半导体标准中实现的精度相似。与传统的电阻标准不同,新型石墨烯器件在4.2 K下仍然精确量化,大大简化了实际计量。这一突破是通过在晶圆级上可扩展的碳化硅技术实现的卓越石墨烯质量而实现的,并为未来电子产品的大规模应用展示了巨大的前景。

英文摘要:

We report development of a quantum Hall resistance standard accurate to a few parts in a billion at 300 mK and based on large area epitaxial graphene. The remarkable precision constitutes an improvement of four orders of magnitude over the best results obtained in exfoliated graphene and is similar to the accuracy achieved in well-established semiconductor standards. Unlike the traditional resistance standards the novel graphene device is still accurately quantized at 4.2 K, vastly simplifying practical metrology. This breakthrough was made possible by exceptional graphene quality achieved with scalable silicon carbide technology on a wafer scale and shows great promise for future large scale applications in electronics.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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