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arXiv quant-ph/0404003quant-ph
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可逆电路的故障测试

Fault Testing for Reversible Circuits

Ketan N. Patel, John P. Hayes, Igor L. Markov

摘要:

可逆电路的应用可以在低功耗计算、密码学、通信、数字信号处理和新兴的量子计算领域中找到。此外,低功耗应用的原型电路已经在CMOS中制造。无论最终采用何种技术,测试肯定是任何健壮实现中的重要组成部分。我们考虑测试集生成问题。可逆性从根本上影响了测试问题,使其比不可逆情况简单得多。例如,我们表明,任何测试集,检测所有单一的固定在故障的可逆电路也检测到所有多个固定在故障。我们提出了有效的测试集建设标准的固定故障模型,以及通常棘手的细胞故障模型。我们还给出了一个实用的测试集生成算法,整数线性规划公式的基础上,产生的测试集的大小约为传统的ATPG的一半。

英文摘要:

Applications of reversible circuits can be found in the fields of low-power computation, cryptography, communications, digital signal processing, and the emerging field of quantum computation. Furthermore, prototype circuits for low-power applications are already being fabricated in CMOS. Regardless of the eventual technology adopted, testing is sure to be an important component in any robust implementation. We consider the test set generation problem. Reversibility affects the testing problem in fundamental ways, making it significantly simpler than for the irreversible case. For example, we show that any test set that detects all single stuck-at faults in a reversible circuit also detects all multiple stuck-at faults. We present efficient test set constructions for the standard stuck-at fault model as well as the usually intractable cell-fault model. We also give a practical test set generation algorithm, based on an integer linear programming formulation, that yields test sets approximately half the size of those produced by conventional ATPG.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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