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arXiv 0905.1792quant-ph
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量子线路故障检测的概率模型

Probabilistic model of fault detection in quantum circuits

Anindita Banerjee, Anirban Pathak

摘要:

结果表明,量子线路的故障测试不遵循传统的经典技术。如果电路中包含像Hadamard门这样的概率门,那么经典的测试向量概念就失效了。我们报道了量子故障的几个新的显著特征,并提出了一种检测量子线路中功能故障的一般方法。该技术可以产生测试向量,用于检测不同类型的故障。给出了具体的例子和时间复杂度的建议量子故障检测算法。

英文摘要:

It is shown that the fault testing for quantum circuits does not follow conventional classical techniques. If probabilistic gate like Hadamard gate is included in a circuit then the classical notion of test vector is shown to fail. We have reported several new and distinguishing features of quantum fault and also presented a general methodology for detection of functional faults in a quantum circuit. The technique can generate test vectors for detection of different kinds of fault. Specific examples are given and time complexity of the proposed quantum fault detection algorithm is reported.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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