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arXiv quant-ph/0306113quant-ph
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量子成像和计量学

Quantum Imaging and Metrology

Hwang Lee, Pieter Kok, Jonathan P. Dowling

摘要:

对量子纠缠的操纵在提高陀螺仪、时钟甚至计算机等设备的性能方面具有巨大的潜力。类似的改进已经被证明用于光刻和显微镜。本文综述了量子纠缠在成像和计量学中的应用。

英文摘要:

The manipulation of quantum entanglement has found enormous potential for improving performances of devices such as gyroscopes, clocks, and even computers. Similar improvements have been demonstrated for lithography and microscopy. We present an overview of some aspects of enhancement by quantum entanglement in imaging and metrology.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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