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arXiv 1908.02378quant-ph

Robust quantum metrology with explicit symmetric states

Yingkai Ouyang, Nathan Shettell, Damian Markham

英文摘要:

Quantum metrology is a promising practical use case for quantum technologies, where physical quantities can be measured with unprecedented precision. In lieu of quantum error correction procedures, near term quantum devices are expected to be noisy, and we have to make do with noisy probe states. We prove that, for a set of carefully chosen symmetric probe states that lie within certain quantum error correction codes, quantum metrology exhibits an advantage over classical metrology even after the probe states are corrupted by a constant number of erasure and dephasing errors. These probe states prove useful for robust metrology not only in the NISQ regime, but also in the asymptotic setting where they achieve Heisenberg scaling. This brings us closer towards making robust quantum metrology a technological reality.

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