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arXiv physics/0208027physics.ins-dethep-ph
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初始杂质和辐照条件对粒子探测器硅中缺陷产生和退火的影响

The influence of initial impurities and irradiation conditions on defect production and annealing in silicon for particle detectors

Ionel Lazanu, Sorina Lazanu

摘要:

在新加速器的粒子物理实验或物理目标的太空任务中,硅探测器将暴露在极端辐射条件下。在这些环境中长期运行的主要障碍是探测器参数的变化,辐照后材料性能的变化。在本论文中开发的唯象模型是能够定量地解释,没有自由参数,粒子辐照后,在硅中的原生缺陷的生产和它们的演变向平衡,为一个大范围的原生缺陷的产生率。考虑了空位-间隙湮没、间隙向阱的迁移、双空位和空位-杂质复合物(VP、VO、V_2O、CiO_1和CiCs)的形成。系统地研究了磷、氧、碳等不同初始杂质浓度以及辐照条件对反应的影响。还研究了缺陷产生率、温度和缺陷浓度随时间的变化关系。

英文摘要:

Silicon detectors in particle physics experiments at the new accelerators or in space missions for physics goals will be exposed to extreme radiation conditions. The principal obstacles to long-term operation in these environments are the changes in detector parameters, consequence of the modifications in material properties after irradiation. The phenomenological model developed in the present paper is able to explain quantitatively, without free parameters, the production of primary defects in silicon after particle irradiation and their evolution toward equilibrium, for a large range of generation rates of primary defects. Vacancy-interstitial annihilation, interstitial migration to sinks, divacancy and vacancy-impurity complex (VP, VO, V2O, CiOi and CiCs) formation are taken into account. The effects of different initial impurity concentrations of phosphorus, oxygen and carbon, as well as of irradiation conditions are systematically studied. The correlation between the rate of defect production, the temperature and the time evolution of defect concentrations is also investigated.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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