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arXiv physics/0110052physics.acc-ph
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Single Shot亚皮秒束团电光特性研究

A Single Shot, Sub-picosecond Beam Bunch Characterization with Electro-optic Techniques

Y. K. Semertzidis, R. Burns, V. Castillo, R. Larsen, D. M. Lazarus, D. Nikas, C. Ozben, T. Srinivasan-Rao, A. Stillman, T. Tsang, L. Kowalski

摘要:

在过去的十年中,加速器中的电子束长度已经急剧减少到几皮秒\cite{Uesaka94,Trotz97}的范围。测量这些短束的长度以及纵向轮廓已经成为许多机构\cite{Uesaka97,Liu97,Hutchins00}的研究课题。其中一种技术是利用双折射晶体附近的电子通过所产生的电场来改变其光学特性。然后,可以使用成熟的电光技术来测量电子聚束的时间特性。在本文中,我们提出了一种新的,非侵入性的,单次拍摄的方法,以提高分辨率几十飞秒,使亚毫米束长度可以测量。

英文摘要:

In the past decade, the bunch lengths of electrons in accelerators have decreased dramatically to the range of a few picoseconds \cite{Uesaka94,Trotz97}. Measurement of the length as well as the longitudinal profile of these short bunches have been a topic of research in a number of institutions \cite{Uesaka97,Liu97,Hutchins00}. One of the techniques uses the electric field induced by the passage of electrons in the vicinity of a birefringent crystal to change its optical characteristics. Well-established electro-optic techniques can then be used to measure the temporal characteristics of the electron bunch. In this paper we present a novel, non-invasive, single-shot approach to improve the resolution to tens of femtoseconds so that sub-millimeter bunch length can be measured.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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