利用相干同步辐射测量超短电子脉冲波形的方法
A Method for Ultrashort Electron Pulse Shape-Measurement Using Coherent Synchrotron Radiation
摘要：
本文讨论了X射线自由电子激光（XFEL）亚皮秒电子束团纵向轮廓的无损测量方法。该方法是基于检测的相干同步辐射（CSR）光谱产生的束流通过一个偶极磁铁系统。这项工作也包含了一个系统的治疗同步辐射理论的基础上的CSR。同步辐射的标准理论使用了几个近似，其适用性限制往往被遗忘：在这里，我们提出了一个系统的讨论这些假设。然后导出并讨论了沿圆弧运动的电子的相干同步辐射的性质。我们还描述了一种有效的和实用的诊断技术的基础上利用电磁波荡器记录到中心锥的相干辐射脉冲的能量。该测量必须用不同的波荡器谐振频率重复多次，以便重建聚束形状因子的模量。从这些数据中的聚束轮廓函数的检索是通过反卷积技术进行的：对于目前的工作，我们利用一个约束反卷积方法。我们用数值例子说明了所提出的方法在TESLA试验设施（TTF）加速器的电子束诊断的潜力。在这里，我们选择，强调，实验旨在测量的强烈非高斯电子束团的轮廓在TTF飞秒模式操作。我们证明了皮秒条纹相机和CSR光谱仪的串联组合可以用于从具有窄的前导峰和长尾的电子聚束中提取形状信息。
英文摘要：
In this paper we discuss a method for nondestructive measurements of the longitudinal profile of sub-picosecond electron bunches for X-Ray Free Electron Lasers (XFELs). The method is based on the detection of the Coherent Synchrotron Radiation (CSR) spectrum produced by a bunch passing a dipole magnet system. This work also contains a systematic treatment of synchrotron radiation theory which lies at the basis of CSR. Standard theory of synchrotron radiation uses several approximations whose applicability limits are often forgotten: here we present a systematic discussion about these assumptions. Properties of coherent synchrotron radiation from an electron moving along an arc of a circle are then derived and discussed. We describe also an effective and practical diagnostic technique based on the utilization of an electromagnetic undulator to record the energy of the coherent radiation pulse into the central cone. This measurement must be repeated many times with different undulator resonant frequencies in order to reconstruct the modulus of the bunch form-factor. The retrieval of the bunch profile function from these data is performed by means of deconvolution techniques: for the present work we take advantage of a constrained deconvolution method. We illustrate with numerical examples the potential of the proposed method for electron beam diagnostics at the TESLA Test Facility (TTF) accelerator. Here we choose, for emphasis, experiments aimed at the measure of the strongly non-Gaussian electron bunch profile in the TTF femtosecond-mode operation. We demonstrate that a tandem combination of a picosecond streak camera and a CSR spectrometer can be used to extract shape information from electron bunches with a narrow leading peak and a long tail.
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