arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2106.01032physics.acc-ph
收藏

电子存储环中微聚束不稳定性的概述及其诊断技术的演进

Overview of the Micro-bunching Instability in Electron Storage Rings and Evolving Diagnostics

Miriam Brosi

AI总结:

本文概述电子存储环中微聚束不稳定性的机理及其对束流参数和同步辐射的影响,并探讨逐圈、逐束团诊断技术进步如何深化对该现象的理解,为下一代光源和对撞机提供参考。

摘要:

微聚束不稳定性是一种纵向不稳定性,会导致纵向相空间中电荷分布发生动力学形变。它影响纵向电荷分布,从而影响所发射的相干同步辐射光谱,以及电子束团的能量分布。不仅不稳定性发生所对应的束团电流阈值,而且不稳定性阈值以上的动力学行为都强烈依赖于机器参数,例如加速电压、动量压缩因子和束流能量。所有这些使得对微聚束不稳定性的理解以及潜在的缓解或控制成为下一代光源和环形 $e^+e^-$ 对撞机的一个重要课题。本报告将概述微聚束不稳定性,并讨论逐圈和逐束团诊断技术的进步如何引领我们更深入地理解这一引人入胜的现象。

英文摘要:

The micro-bunching instability is a longitudinal instability that leads to dynamical deformations of the charge distribution in the longitudinal phase space. It affects the longitudinal charge distribution, and thus the emitted coherent synchrotron radiation spectra, as well as the energy distribution of the electron bunch. Not only the threshold in the bunch current above which the instability occurs, but also the dynamics above the instability threshold strongly depends on machine parameters, e.g. accelerating voltage, momentum compaction factor, and beam energy. All this makes the understanding and potential mitigation or control of the micro-bunching instability an important topic for the next generation of light sources and circular $e^+e^-$ colliders. This contribution will give an overview of the micro-bunching instability and discuss how technological advances in the turn-by-turn and bunch-by-bunch diagnostics are leading to a deeper understanding of this intriguing phenomenon.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑