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arXiv 2408.09608cond-mat.mtrl-scicond-mat.mes-hall
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利用氧 K 边的软 X 射线叠层成像观测铁电畴

Imaging ferroelectric domains with soft X-ray ptychography at the oxygen K-edge

Tim A. Butcher, Nicholas W. Phillips, Chia-Chun Wei, Shih-Chao Chang, Igor Beinik, Karina Thånell, Jan-Chi Yang, Shih-Wen Huang, Jörg Raabe, Simone Finizio

AI总结:

本文提出在 O K 边利用线偏振软 X 射线叠层二色成像,实现自支撑 BiFeO$_3$ 薄膜铁电畴可视化,并与 Fe L$_3$ 边反铁磁成像互补。

摘要:

通过在约 530 eV 的 O K 边使用线偏振 X 射线进行叠层二色成像,研究人员使自支撑 BiFeO$_3$ 薄膜的铁电畴结构实现了可视化。二色衬度在 O 2p 态与 Fe 3d 轨道杂化对应的能量处达到最大;该杂化能级被钙钛矿结构的八面体晶体场分裂。由此获得的显微图像补充了 Fe L$_3$ 边处反铁磁贡献的叠层成像。该方法可推广用于分离其他多铁氧化物中不同的铁性贡献。

英文摘要:

The ferroelectric domain structure of a freestanding BiFeO$_3$ film was visualized by ptychographic dichroic imaging with linearly polarized X-rays at the O K-edge around 530 eV. The dichroic contrast is maximized at the energy of the hybridization of the O 2p state and the Fe 3d orbitals, which is split by the octahedral crystal field of the perovskite structure. The microscopy images thus obtained complement the ptychographic imaging of the antiferromagnetic contribution at the Fe L$_3$-edge. The approach can be extended to the separation of different ferroic contributions in other multiferroic oxides.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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