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arXiv 2501.06005cond-mat.mtrl-sciphysics.app-ph
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铁电 Hf0.5Zr0.5O2 薄膜中极化与氧空位迁移的耦合实现室温以上电控热存储器

The coupling of polarization and oxygen vacancy migration in ferroelectric Hf0.5Zr0.5O2 thin films enables electrically controlled thermal memories above room temperature

Didac Barneo, Rafael Ramos, Hugo Romero, Victor Leboran, Noa Varela-Dominguez, Jose A. Pardo, Francisco Rivadulla, Eric Langenberg

AI总结:

本文揭示外延 Hf0.5Zr0.5O2 铁电薄膜中极化与氧空位迁移的耦合机制,实现室温以上具有 1.6 开关比且状态稳定的非易失性电控双态热存储器。

摘要:

本文研究外延 Hf0.5Zr0.5O2 铁电薄膜作为非易失性电场调制热存储器潜在候选材料的性能。研究发现,金属/Hf0.5Zr0.5O2/YSZ 器件热导率的电场依赖性具有迟滞特性,类似于极化-电场迟滞回线:当从顶部金属电极施加大的正(负)电压时,热导率达到最大值(最小值)。这种动态热响应与铁电极化和氧离子迁移之间的耦合相容,其中氧空位是主要的声子散射源,而极化充当产生迟滞的电活性离子迁移势垒。这一新机制实现了高(ON)和低(OFF)热导率两种非易失性热态,ON/OFF 比为 1.6。ON 态和 OFF 态均表现出较高的时间稳定性,但开关速度受 YSZ 电极中离子迁移率的限制。

英文摘要:

Here we investigate epitaxial Hf0.5Zr0.5O2 ferroelectric thin films as potential candidates to be used as non-volatile electric-field-modulated thermal memories. The electric-field dependence of the thermal conductivity of metal/Hf0.5Zr0.5O2/YSZ devices is found to be hysteretic, resembling the polarization vs electric field hysteresis loops, being maximum (minimum) at large applied positive (negative) voltages from the top metallic electrode. This dynamic thermal response is compatible with the coupling between the ferroelectric polarization and the oxygen ion migration, in which the oxygen vacancies are the main phonon scattering sources and the polarization acts as an electrically active ion migration barrier that creates the hysteresis. This new mechanism enables two non-volatile thermal states: high (ON) and low (OFF) thermal conductivity, with an ON/OFF ratio of 1.6. Both the ON and OFF states exhibit high stability over time, though the switching speed is limited by ion mobility in the YSZ electrode.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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