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arXiv 2406.02249physics.ins-detnucl-ex
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一种低温下SiPM外部串扰概率的新型测量方法

A novel measurement method for SiPM external crosstalk probability at low temperature

Guanda Li, Lei Wang, Xilei Sun, Fang Liu, Cong Guo, Kangkang Zhao, Lei Tian, Zeyuan Yu, Zhilong Hou, Chi Li, Yu Lei, Bin Wang, Rongbin Zhou

AI总结:

本文提出了一种在液氮温度下使用两个面对面SiPM且无需复杂光学设计的新型外部串扰光子概率测量方法,发现该概率与过电压呈线性关系,并能额外测得低温下SiPM对eCT光子的光子探测效率。

摘要:

硅光电倍增管(SiPMs)正被视为传统光电倍增管(PMTs)的潜在替代品。然而,SiPMs的一个显著缺点是串扰(CT),即光子通过其他像素传播,导致二次雪崩。根据二次雪崩发生在同一个SiPM内还是不同的SiPM内,CT可分为内部串扰和外部串扰。目前已有许多定量估计内部串扰(iCT)百分比的方法。然而,外部串扰(eCT)尚未得到广泛研究。\n本文提出了一种新型测量方法,用于测量在单像素雪崩期间发射外部串扰光子的概率。该方法使用两个相同的SiPM面对面放置的装置,且无需复杂的光学设计。整个设备封闭在一个不锈钢腔室内,作为避光外壳,并保持在液氮温度下。实验装置包含两个Sensl J-60035 SiPM芯片以及两个0.5英寸的Hamamatsu Photonics(HPK)VUV4 S13370-6050CN SiPM阵列。研究结果表明,对于两种SiPM样品,发射外部串扰光子的概率与SiPM过电压之间呈线性关系。令人惊讶的是,这种新型测量方法还提供了低温下SiPM对eCT光子的光子探测效率(PDE)的测量结果。

英文摘要:

Silicon photomultipliers (SiPMs) are being considered as potential replacements for conventional photomultiplier tubes (PMTs). However, a significant disadvantage of SiPMs is crosstalk (CT), wherein photons propagate through other pixels, resulting in secondary avalanches. CT can be categorized into internal crosstalk and external crosstalk based on whether the secondary avalanche occurs within the same SiPM or a different one. Numerous methods exist for quantitatively estimating the percentage of internal crosstalk (iCT). However, external crosstalk (eCT) has not been extensively studied. This article presents a novel measurement method for the probability of emitting an external crosstalk photon during a single pixel avalanche, using a setup involving two identical SiPMs facing each other, and without the need for complex optical designs. The entire apparatus is enclosed within a stainless steel chamber, functioning as a light-tight enclosure, and maintained at liquid nitrogen temperature. The experimental setup incorporates two Sensl J-60035 SiPM chips along with two 0.5-inch Hamamatsu Photonics (HPK) VUV4 S13370-6050CN SiPM arrays. The findings show a linear relationship between the probability of emitting an external crosstalk photon and the SiPM overvoltage for both SiPM samples. Surprisingly, this novel measurement method also rovides measurements of the SiPM photon detection efficiency (PDE) for eCT photons at low temperature.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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