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arXiv 2302.03565physics.opticsstat.AP
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有限光子条件下荧光显微镜的统计分辨率度量

A statistical resolution measure of fluorescence microscopy with finite photons

Yilun Li, Fang Huang

AI总结:

本文提出有限光子下荧光显微镜分辨能力的统计度量方法,结合衍射极限与光子统计特性,利用Cramer-Rao下界量化周期结构可分辨性,为现代荧光显微技术确立了含噪声的实际分辨率理论度量。

摘要:

1873年Ernest Abbe首次发现远场显微镜的分辨率极限,认为其由数值孔径和光波长决定,约为λ/2NA。随着过去一个世纪现代荧光显微镜与纳米显微技术的发展,人们认识到仅凭Abbe的分辨率定义无法单独表征显微镜系统的分辨能力。为确定荧光显微镜的实际分辨率,光子噪声仍是尚未纳入基于统计学的理论框架的一个基本因素。诸如共聚焦等技术允许以增加光子噪声为代价来提升分辨率极限,这可能增强或恶化对荧光标记目标的分辨能力。作为有限光子下荧光显微镜分辨能力的理论度量,我们综合考虑衍射极限和光子统计特性,量化了荧光显微镜系统中周期结构的可分辨性。利用参数目标的Cramer-Rao下界,所得的精度下界在存在噪声的情况下,为各种现代荧光显微方法的理论分辨能力确立了实用度量。

英文摘要:

First discovered by Ernest Abbe in 1873, the resolution limit of a far-field microscope is considered determined by the numerical aperture and wavelength of light, approximately $λ$/2NA. With the advent of modern fluorescence microscopy and nanoscopy methods over the last century, it is recognized that Abbe's resolution definition alone could not solely characterize the resolving power of the microscope system. To determine the practical resolution of a fluorescence microscope, photon noise remains one essential factor yet to be incorporated in a statistics-based theoretical framework. Techniques such as confocal allow trading photon noise in gaining its resolution limit, which may increase or worsen the resolvability towards fluorescently tagged targets. Proposed as a theoretical measure of fluorescence microscopes' resolving power with finite photons, we quantify the resolvability of periodic structures in fluorescence microscopy systems considering both the diffraction limit and photon statistics. Using the Cramer-Rao Lower Bound of a parametric target, the resulting precision lower bound establishes a practical measure of the theoretical resolving power for various modern fluorescence microscopy methods in the presence of noise.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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