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arXiv 1109.4512physics.optics
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用傅里叶平面荧光泄漏辐射显微术直接表征平面波导模式

Direct characterization of planar waveguide modes by Fourier plane fluorescence leakage radiation microscopy

Douguo Zhang, Qiang Fu, Xiangxian Wang, Pei Wang, Hai Ming

摘要:

在这封信中,泄漏辐射显微镜(LRM)扩展到表征平面波导模式(WMs),而不是表面等离子体激元(SPPs)利用WMs和荧光发射之间的耦合。从荧光LRM的傅里叶平面像可以同时快速地导出同一平面波导中不同波长的传输常数。数值模拟计算了这些模式的传播常数,与实验结果一致。我们的实验提供了一个简单而高效的方法来表征平面波导。

英文摘要:

In this letter, the leakage radiation microscopy (LRM) is extended into characterization of planar waveguide modes (WMs) rather than surface plasmon polaritons (SPPs) taking advantages of the coupling between WMs and fluorescence emission. Propagation constants of different WMs allowed in the same planar waveguide can be simultaneously and rapidly derived from the Fourier plane image of fluorescence based LRM. Numerical simulations are also carried out to calculate propagation constants of these modes, which are consistent with experimental results. Our experiments provide a simple but high efficient method to characterize planar waveguides.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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