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arXiv 2203.09217cond-mat.mes-hallcond-mat.mtrl-sci
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石墨烯器件的原位电导映射和开关行为

Mapping Conductance and Switching Behavior of Graphene Devices In Situ

Ondrej Dyck, Jacob L. Swett, Charalambos Evangeli, Andrew R. Lupini, Jan A. Mol, Stephen Jesse

摘要:

石墨烯已被提议用于各种纳米器件设计,其中许多利用涌现的量子特性实现器件功能。然而,可视化,测量和操纵在纳米和原子尺度上变得不平凡,代表了在出现量子效应的长度尺度上的器件制造,表征和优化的重大挑战。在这里,我们提出了在2D纳米电子器件,电子束诱导调制和成像与次级电子电子束感应电流(SEEBIC)之间的十字路口的原则性结果的证明。我们介绍了一种与扫描透射电子显微镜调查兼容的设备平台。然后,我们展示了如何SEEBIC成像技术可用于可视化单层石墨烯纳米器件的电导和连接性,即使在较厚的衬底上支持(常规成像失败的条件下)。最后,我们表明,SEEBIC成像技术可以检测到微妙的差异,通过时间在非欧姆石墨烯nanoconstrictions的电荷传输表明潜在的揭示动态电子过程。

英文摘要:

Graphene has been proposed for use in various nanodevice designs, many of which harness emergent quantum properties for device functionality. However, visualization, measurement, and manipulation become non-trivial at nanometer and atomic scales, representing a significant challenge for device fabrication, characterization, and optimization at length scales where quantum effects emerge. Here, we present proof of principle results at the crossroads between 2D nanoelectronic devices, e-beam-induced modulation, and imaging with secondary electron e-beam induced currents (SEEBIC). We introduce a device platform compatible with scanning transmission electron microscopy investigations. We then show how the SEEBIC imaging technique can be used to visualize conductance and connectivity in single layer graphene nanodevices, even while supported on a thicker substrate (conditions under which conventional imaging fails). Finally, we show that the SEEBIC imaging technique can detect subtle differences in charge transport through time in non-ohmic graphene nanoconstrictions indicating the potential to reveal dynamic electronic processes.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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