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arXiv 2202.08167cond-mat.mtrl-sciphysics.app-ph
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半导体非平衡载流子有效寿命的非绝热分子动力学模拟

Effective Lifetime of Non-Equilibrium Carriers in Semiconductors from Non-Adiabatic Molecular Dynamics Simulations

Shanshan Wang, Menglin Huang, Yu-Ning Wu, Weibin Chu, Jin Zhao, Aron Walsh, Xin-Gao Gong, Su-Huai Wei, Shiyou Chen

摘要:

半导体中非平衡电子和空穴的寿命对于太阳能电池和光电应用至关重要。基于含时密度泛函理论(TDDFT)的非绝热分子动力学(NAMD)模拟被广泛用于研究激发态载流子动力学。然而,计算的载流子寿命往往与实验结果相差几个数量级。在这项工作中,通过重新审视载流子寿命的定义,并考虑不同的复合机制,我们报告了一个系统的程序,用于计算实际半导体晶体中的有效载流子寿命,可以直接与实验测量进行比较。计算结果表明,考虑所有的复合机制和使用合理的载流子和缺陷密度是计算有效寿命的关键。当NAMD模拟只考虑Shockey-Read-Hall(SRH)缺陷辅助和带间非辐射复合而忽略带间辐射复合时,由于太阳光照射下的非平衡载流子和缺陷密度远高于实际半导体,计算寿命无效,与实验结果有较大差异。使用我们的程序,计算的有效寿命的卤化物钙钛矿CH 3 NH3 PbI 3同意与实验。它主要由带间辐射复合和缺陷辅助的非辐射复合决定,而带间非辐射复合可以忽略不计。这些结果表明,它是可以准确地计算载流子寿命的NAMD模拟的基础上,但直接计算的值应转换为有效的寿命与实验进行比较。修正后的方法可广泛应用于未来的载流子寿命模拟。

英文摘要:

The lifetime of non-equilibrium electrons and holes in semiconductors is crucial for solar cell and optoelectronic applications. Non-adiabatic molecular dynamics (NAMD) simulations based on time-dependent density functional theory (TDDFT) are widely used to study excited-state carrier dynamics. However, the calculated carrier lifetimes are often different from experimental results by orders of magnitude. In this work, by revisiting the definition of carrier lifetime and considering different recombination mechanisms, we report a systematic procedure for calculating the effective carrier lifetime in realistic semiconductor crystals that can be compared directly to experimental measurements. The procedure shows that considering all recombination mechanisms and using reasonable densities of carriers and defects are crucial in calculating the effective lifetime. When NAMD simulations consider only Shockey-Read-Hall (SRH) defect-assisted and band-to-band non-radiative recombination while neglect band-to-band radiative recombination, and the densities of non-equilibrium carriers and defects in supercell simulations are much higher than those in realistic semiconductors under solar illumination, the calculated lifetimes are ineffective and thus differ from experiments. Using our procedure, the calculated effective lifetime of the halide perovskite CH3NH3PbI3 agrees with experiments. It is mainly determined by band-to-band radiative and defect-assisted non-radiative recombination, while band-to-band non-radiative recombination is negligible. These results indicate that it is possible to calculate carrier lifetimes accurately based on NAMD simulations, but the directly calculated values should be converted to effective lifetimes for comparison to experiments. The revised procedure can be widely applied in future carrier lifetime simulations.

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