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arXiv 1906.07464cond-mat.mtrl-sci
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半导体中温度相关载流子动力学的μ子探针

Muon probes of temperature-dependent charge carrier kinetics in semiconductors

K. Yokoyama, J. S. Lord, P. W. Mengyan, M. R. Goeks, R. L. Lichti

摘要:

我们已经应用了光激发μ子自旋光谱技术(光- $μ$ SR)的本征锗的目标是开发一种新的方法来表征在广泛的半导体过剩载流子动力学。μ子自旋弛豫速率可以是过剩载流子密度的唯一度量,并用于研究载流子动力学。所得到的载流子寿命谱可以用一个简单的扩散方程来模拟,以确定体复合寿命和载流子迁移率。对这些参数随温度变化的研究可以揭示复合和扩散机制。

英文摘要:

We have applied the photoexcited muon spin spectroscopy technique (photo-$μ$SR) to intrinsic germanium with the goal of developing a new method for characterizing excess carrier kinetics in a wide range of semiconductors. Muon spin relaxation rates can be a unique measure of excess carrier density and utilized to investigate carrier dynamics. The obtained carrier lifetime spectrum can be modeled with a simple diffusion equation to determine bulk recombination lifetime and carrier mobility. Temperature dependent studies of these parameters can reveal the recombination and diffusion mechanism.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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