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arXiv 2202.00115astro-ph.IM
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用MKID测试微波应用中的低损耗微带材料

Testing low-loss microstrip materials with MKIDs for microwave applications

J. Hood, P. Barry, T. Cecil, C. Chang, S. Meyer, J. Li, Z. Pan, E. Shirokoff, A. Tang

摘要:

未来毫米波段天空的测量需要一个低损耗的超导微带,通常由铌和氮化硅制成,将天线连接到探测器。我们提出了一个简单的设备,用于表征这些低损耗微带在150 GHz。在我们的设备中,我们照亮了一个热源的天线,并比较在150 GHz的测量功率传输下来的不同长度的微带。功率测量是使用微波动态电感检测器(MKID)直接制作到微带电介质,并比较测量的响应提供了一个直接测量的微带损耗。我们提出的结构提供了一个简单的设备(4层和DRIE蚀刻),用于表征各种微带材料和基板的介电损耗。我们目前使用这些设备的初步结果。我们证明,毫米波长的微带线,几十毫米长的损耗,可以使用一个实际的铝MKID与黑体源在几十开尔文测量。

英文摘要:

Future measurements of the millimeter-wavelength sky require a low-loss superconducting microstrip, typically made from niobium and silicon-nitride, coupling the antenna to detectors. We propose a simple device for characterizing these low-loss microstrips at 150 GHz. In our device we illuminate an antenna with a thermal source and compare the measured power at 150 GHz transmitted down microstrips of different lengths. The power measurement is made using Microwave Kinetic Inductance Detectors (MKIDs) fabricated directly onto the microstrip dielectric, and comparing the measured response provides a direct measurement of the microstrip loss. Our proposed structure provides a simple device (4 layers and a DRIE etch) for characterizing the dielectric loss of various microstrip materials and substrates. We present initial results using these devices. We demonstrate that the millimeter wavelength loss of microstrip lines, a few tens of millimeters long, can be measured using a practical aluminum MKID with a black body source at a few tens of Kelvin.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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