High-uniformity TiN/Ti/TiN multilayers for the development of Microwave Kinetic Inductance Detector
Mario De Lucia, E. Baldwin, G. Ulbricht, J. D. Piercy, O. Creaner, C. Bracken, T. P. Ray
备注：
11 pages, 7 figures. Proceedings Volume 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X; 1219105 (2022) [REPLACEMENT is to correct typo in arxiv metadata]
发表信息：
Proc. SPIE 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X, 1219105 (29 August 2022)
Microwave Kinetic Inductance Detectors (MKIDs) are a class of superconducting cryogenic detectors that simultaneously exhibit energy resolution, time resolution and spatial resolution. The pixel yield of MKID arrays is usually a critical figure of merit in the characterisation of an MKIDs array. Currently, for MKIDs intended for the detection of optical and near-infrared photons, only the best arrays exhibit a pixel yield as high as 75-80%. The uniformity of the superconducting film used for the fabrication of MKIDs arrays is often regarded as the main limiting factor to the pixel yield of an array. In this paper we will present data on the uniformity of the TiN/Ti/TiN multilayers deposited at the Tyndall National Institute and compare these results with a statistical model that evaluates how inhomogeneities affect the pixel yield of an array.
Interplay between phonon downconversion efficiency, density of states at Fermi energy, and intrinsic energy resolution for microwave kinectic inductance detectors
CCAT: Characterization of the first science-grade MKID array for the Prime-Cam 850 GHz module
University of British Columbia（不列颠哥伦比亚大学）；National Institute of Standards and Technology（美国国家标准与技术研究院）；Dalhousie University（达尔豪斯大学）；NRC Herzberg Astronomy & Astrophysics Research Centre（NRC赫茨伯格天文学与天体物理学研究中心）；University of California, Riverside（加州大学河滨分校）；Cornell University（康奈尔大学）；Duke University（杜克大学）；Johns Hopkins University（约翰斯·霍普金斯大学）
