arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2106.04793cond-mat.mtrl-sci
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用瞬态X射线光谱学研究元素特定的电子和结构动力学

Element-specific electronic and structural dynamics using transient X-ray spectroscopy

Hanzhe Liu, Isabel M. Klein, Jonathan M. Michelsen, Scott K. Cushing

摘要:

瞬态X射线吸收技术可以测量材料或多层结中元素边缘的超快动力学,为并行过程的去卷积提供了巨大的潜力。然而,对X射线边缘的光激发变化的解释并不像用光学或红外波长直接探测跃迁那样简单。核心能级跃迁留下的核心空穴扭曲了测量的吸收和反射光谱,隐藏和揭示了光诱导过程的不同方面。在这个角度来看,我们描述了瞬态X射线实验的实施和解释。本说明包括在设计实验时如何选择最佳波长和相应的X射线源的指南。作为一个例子,我们专注于越来越多地使用极紫外(XUV)光谱,以了解性能限制行为的太阳能材料,如测量极化子形成,电子和空穴动力学,以及在每一层的金属氧化物半导体结的电荷传输。测量多层结的每一层中的光激发载流子的能力可以证明在分子,材料及其组合的研究中特别有影响力,这些分子,材料及其组合导致光化学和光电化学中的功能器件。

英文摘要:

Transient X-ray absorption techniques can measure ultrafast dynamics of the elemental edges in a material or multiple layer junction, giving them immense potential for deconvoluting concurrent processes. However, the interpretation of the photoexcited changes to an X-ray edge is not as simple as directly probing a transition with optical or infrared wavelengths. The core hole left by the core-level transition distorts the measured absorption and reflection spectra, both hiding and revealing different aspects of a photo-induced process. In this perspective, we describe the implementation and interpretation of transient X-ray experiments. This description includes a guide of how to choose the best wavelength and corresponding X-ray sources when designing an experiment. As an example, we focus on the rising use of extreme ultraviolet (XUV) spectroscopy for understanding performance limiting behaviors in solar energy materials, such as measurements of polaron formation, electron and hole kinetics, and charge transport in each layer of a metal-oxide-semiconductor junction. The ability of measuring photoexcited carriers in each layer of a multilayer junction could prove particularly impactful in the study of molecules, materials, and their combinations that lead to functional devices in photochemistry and photoelectrochemistry.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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