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arXiv 2103.08950physics.acc-ph
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二次离子束

Secondary Ion Beams

Klaus Knie

摘要:

次级离子束是通过用稳定核素(在大多数情况下是质子)的初级束轰击生产靶或通过重初级粒子的碎裂而产生的粒子束。这些方法用于不能被引入离子源(或用作靶)的短寿命、不稳定的粒子。次级束粒子可以通过以下方式产生:i)在第二离子源中轰击重的稳定元素(ISOL方法),ii)重束粒子的碎裂,或iii)粒子-反粒子对(例如π介子或反质子)的产生。次级束的衰变产物束(例如π介子衰变的μ子或中微子)可以被认为是三级束。

英文摘要:

Secondary ion beams are beams of particles produced by bombarding a production target with a primary beam of a stable nuclide (in most cases protons) or by fragmentation of heavy primary particles. These methods are used for short lived, instable particles which cannot be introduced into the ion source (or used as target). The secondary beam particles can be produced i) by bombarding a heavy, stable element in a second ion source (ISOL method), ii) by fragmentation of heavy beam particles, or iii) by creation of particle-antiparticle pairs (e.g. pions or antiprotons). Beams of decay products from secondary beams (e.g. muons or neutrinos from pion decay) can be considered as tertiary beams.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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