分段箔SEM格栅的梁试验
Beam Test of a Segmented Foil SEM Grid
摘要：
一个原型的二次电子发射监测器（SEM）安装在8 GeV的质子传输线的MiniBooNE实验在费米实验室。SEM是由5 μ m钛箔制成的分段网格，预期用于费米实验室的120 GeV NuMI束。与以前的工作者类似，我们发现，次级电子信号的完全收集需要偏置电压来将喷射的电子从箔上干净地吸引，并且这种效果在较大的束强度下更加明显。在3、7和8mm的光束宽度下测量SEM的光束质心和宽度分辨率，并与计算结果进行比较。外推来自该光束测试的数据，我们预计在具有1 mm光斑尺寸的NuMI光束中，质心和宽度分辨率分别为20 um和25 um。
英文摘要：
A prototype Secondary-electron Emission Monitor (SEM) was installed in the 8 GeV proton transport line for the MiniBooNE experiment at Fermilab. The SEM is a segmented grid made with 5 um Ti foils, intended for use in the 120 GeV NuMI beam at Fermilab. Similar to previous workers, we found that the full collection of the secondary electron signal requires a bias voltage to draw the ejected electrons cleanly off the foils, and this effect is more pronounced at larger beam intensity. The beam centroid and width resolutions of the SEM were measured at beam widths of 3, 7, and 8 mm, and compared to calculations. Extrapolating the data from this beam test, we expect a centroid and width resolutions of 20um and 25 um, respectively, in the NuMI beam which has 1 mm spot size.
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