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arXiv 2303.06355physics.ins-det
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GEM 箔中随机电极扇形化的制备与表征

Production and characterization of random electrode sectorization in GEM foils

Antonello Pellecchia, Michele Bianco, Rui De Oliveira, Francesco Fallavollita, Davide Fiorina, Nicole Rosi, Piet Verwilligen

AI总结:

本研究针对三重GEM探测器传统分割技术制造难、易有误差的问题,提出随机孔分割技术,经测试验证其可限制扇区间效率损失,是大面积探测器GEM箔制造的可行替代方案。

摘要:

在三重 GEM 探测器中,将 GEM 箔分割为电学独立的扇区可降低放电对探测器造成损坏的概率,并提升探测器的计数率能力;然而,分割后的箔片在两个扇区的交界处存在薄型死区,且在箔片制造过程中,分割图案必须与 GEM 孔图案手动对准,这一过程可能容易出现误差。\n 我们介绍了采用创新 GEM 箔分割技术——“随机孔分割”——制备的三重 GEM 探测器的生产与表征情况,该技术可简化分割型 GEM 箔的制造流程。我们测量了随机孔分割三重 GEM 原型的高压电稳定性和增益均匀性。同时展示了为 CMS 实验 Phase-2 GEM 升级组装的原型的束流测试结果;高统计量效率测量表明,随机孔分割可限制探测器在两个扇区间区域的效率损失,使其成为大面积探测器系统 GEM 箔制造中空白分割的可行替代方案。

英文摘要:

In triple-GEM detectors, the segmentation of GEM foils in electrically independent sectors allows reducing the probability of discharge damage to the detector and improving the detector rate capability; however, a segmented foil presents thin dead regions in the separation between two sectors and the segmentation pattern has to be manually aligned with the GEM hole pattern during the foil manufacturing, a procedure potentially sensitive to errors. We describe the production and characterization of triple-GEM detectors produced with an innovative GEM foil segmentation technique, the ``random hole segmentation'', that allows an easier manufacturing of segmented GEM foils. The electrical stability to high voltage and the gain uniformity of a random-hole segmented triple-GEM prototype are measured. The results of a test beam on a prototype assembled for the Phase-2 GEM upgrade of the CMS experiment are also presented; a high-statistics efficiency measurement shows that the random hole segmentation can limit the efficiency loss of the detector in the areas between two sectors, making it a viable alternative to blank segmentation for the GEM foil manufacturing of large-area detector systems.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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