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arXiv 1301.6989physics.acc-ph
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费米实验室主注入真空室次级电子产额测量

Secondary Electron Yield Measurements of Fermilab's Main Injector Vacuum Vessel

D. J. Scott, D. Capista, K. L. Duel, R. M. Zwaska, S. Greenwald, W. Hartung, Y. Li, T. P. Moore, M. A. Palmer, R. Kirby, M. Pivi, L. Wang

摘要:

我们讨论了费米实验室的主注入器,这将有助于调查的电子云现象,通过直接测量的次级电子产率(SEY)的样品照射在加速器上的新安装所取得的进展。在X项目升级中,主注入器的光束强度将比目前的操作增加三倍。这可能导致射束受到来自电子云的不稳定性的影响。测得的SEY值可用于进一步约束模拟,并帮助我们外推到Project X强度。SEY测试台,开发与康奈尔大学和SLAC,是能够测量SEY从样品使用入射电子束时,样品偏置在不同的电压。我们介绍了试验台的设计和制造以及安装前对样品进行的初步实验室测试结果。

英文摘要:

We discuss the progress made on a new installation in Fermilab's Main Injector that will help investigate the electron cloud phenomenon by making direct measurements of the secondary electron yield (SEY) of samples irradiated in the accelerator. In the Project X upgrade the Main Injector will have its beam intensity increased by a factor of three compared to current operations. This may result in the beam being subject to instabilities from the electron cloud. Measured SEY values can be used to further constrain simulations and aid our extrapolation to Project X intensities. The SEY test-stand, developed in conjunction with Cornell and SLAC, is capable of measuring the SEY from samples using an incident electron beam when the samples are biased at different voltages. We present the design and manufacture of the test-stand and the results of initial laboratory tests on samples prior to installation.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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