TiN涂层和TiZrV吸气剂膜的次级电子产额测量
Secondary Electron Yield Measurements of TiN Coating and TiZrV Getter Film
摘要：
在新一代直线对撞机（NLC）的正电子主阻尼环（MDR）束流管中，残余气体电离和次级电子发射会产生电子云，从而导致循环束流的损失。避免电子云的一种途径是确保真空壁具有低的二次发射产额，因此，我们需要知道候选壁涂层的二次发射产额（SEY）。我们报告SEY测量在SLAC上氮化钛（TiN）和钛锆钒（TiZrV）薄陶瓷沉积膜，以及描述我们的实验装置。
英文摘要：
In the beam pipe of the positron Main Damping Ring (MDR) of the Next Linear Collider (NLC), ionization of residual gases and secondary electron emission give rise to an electron cloud which can cause the loss of the circulating beam. One path to avoid the electron cloud is to ensure that the vacuum wall has low secondary emission yield and, therefore, we need to know the secondary emission yield (SEY) for candidate wall coatings. We report on SEY measurements at SLAC on titanium nitride (TiN) and titanium-zirconium-vanadium (TiZrV) thin sputter-deposited films, as well as describe our experimental setup.
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