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arXiv 1809.07908cond-mat.mtrl-sci
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氢化非晶硅中的二能级系统和生长诱导亚稳态

Two-level systems and growth-induced metastability in hydrogenated amorphous silicon

M. Molina-Ruiz, H. C. Jacks, D. R. Queen, Q. Wang, R. S. Crandall, F. Hellman

摘要:

从2到300 K的比热测量由热线化学气相沉积制备的氢化非晶硅在低温下显示出一个大的过剩比热,显着大于德拜比热计算从声速。所制备的薄膜具有与非晶网络中的亚稳态氢相关的肖特基异常,以及通常与非晶态固体中的隧穿二能级系统相关的大的线性和过量立方项。在200 °C下退火,该温度使氢迁移但不蒸发,不可逆地降低了热容,消除了肖特基异常并留下降低的线性热容。生长温度和H含量的非单调依赖关系,观察在所有的效果,除了声速,这表明隧道二能级系统和肖特基异常与原子氢,并需要低密度区域形成,而声速与硅网络,并提高随着生长温度的增加。

英文摘要:

Specific heat measurements from 2 to 300 K of hydrogenated amorphous silicon prepared by hot-wire chemical vapor deposition show a large excess specific heat at low temperature, significantly larger than the Debye specific heat calculated from the sound velocity. The as-prepared films have a Schottky anomaly that is associated with metastable hydrogen in the amorphous network, as well as large linear and excess cubic term commonly associated with tunneling two-level systems in amorphous solids. Annealing at 200 °C, a temperature that enables hydrogen mobility but not evaporation, irreversibly reduces the heat capacity, eliminating the Schottky anomaly and leaving a reduced linear heat capacity. A non-monotonic dependence on growth temperature and H content is observed in all effects, except for sound velocity, which suggests that the tunneling two-level systems and the Schottky anomaly are associated with atomic hydrogen and require low density regions to form, while sound velocity is associated with the silicon network and improves with increasing growth temperature.

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