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arXiv 1711.03212physics.ins-det
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65 nm CMOS中RD53A像素读出芯片的表征和验证环境

Characterization and Verification Environment for the RD53A Pixel Readout Chip in 65 nm CMOS

Marco Vogt, Hans Krüger, Tomasz Hemperek, Jens Janssen, David Leon Pohl, Michael Daas

摘要:

RD 53合作目前正在设计一个65 nm CMOS技术的大规模原型像素读出芯片,用于HL-LHC的第二阶段升级。RD 53 A芯片将于2017年底上市,并将进行广泛的测试,以确认电路和架构是否为HL-LHC实验的最终像素读出芯片奠定了坚实的基础。RD 53 A芯片的测试和数据采集系统目前正在开发中,以执行单芯片和多芯片模块测量。此外,RD 53 A设计的验证是在专用的仿真环境中进行的。在这项工作中,测试和数据采集系统和仿真环境,这是基于一个模块化的数据采集和系统测试框架的概念和实施。

英文摘要:

The RD53 collaboration is currently designing a large scale prototype pixel readout chip in 65 nm CMOS technology for the phase 2 upgrades at the HL-LHC. The RD53A chip will be available by the end of the year 2017 and will be extensively tested to confirm if the circuit and the architecture make a solid foundation for the final pixel readout chips for the experiments at the HL-LHC. A test and data acquisition system for the RD53A chip is currently under development to perform single-chip and multi-chip module measurements. In addition, the verification of the RD53A design is performed in a dedicated simulation environment. The concept and the implementation of the test and data acquisition system and the simulation environment, which are based on a modular data acquisition and system testing framework, are presented in this work.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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