arXiv 2402.026412024-02-04physics.ins-det

皮秒定时芯片的SiPM读出系统性能研究

Performance studies of a SiPM-readout system with a pico-second timing chip

Xin Xia, Dejing Du, Xiaoshan Jiang, Yong Liu, Bo Lu, Junguang Lyu, Baohua Qi, Manqi Ruan, Xiongbo Yan

AI总结：

本研究针对希格斯工厂实验，开发了55纳米CMOS皮秒定时芯片PIST，并测试了其SiPM读出系统，实现了MIP水平45皮秒和强信号优于10皮秒的定时分辨率，并通过ToT技术将动态范围扩展至40000光电子。

摘要：

针对未来正负电子对撞机实验（即希格斯工厂），采用55纳米CMOS工艺开发了一种皮秒定时（PIST）前端电子芯片。为评估配备PIST芯片的专用SiPM读出系统的定时性能，开展了大量测试。结果表明，对于最小电离粒子（MIP）水平（200光电子）的SiPM信号，系统定时分辨率可达45皮秒；对于大于1200光电子的信号，分辨率优于10皮秒，而PIST芯片的固有定时分辨率为4.76±0.60皮秒。利用时间过阈值（ToT）技术进一步扩展了PIST的动态范围，可覆盖约900光电子至约40000光电子范围内的SiPM响应。

英文摘要：

A pico-second timing (PIST) front-end electronic chip has been developed using $55~\mathrm{nm}$ CMOS technology for future electron-positron collider experiments (namely Higgs factories). Extensive tests have been performed to evaluate the timing performance of a dedicated SiPM-readout system equipped with a PIST chip. The results show that the system timing resolution can achieve $45~\mathrm{ps}$ for SiPM signals at the minimum-ionizing particles (MIP) level ($200~\mathrm{p.e.}$) and better than $ 10~\mathrm{ps}$ for signals larger than $1200~\mathrm{p.e.}$, while the PIST intrinsic timing resolution is $4.76 \pm 0.60~\mathrm{ps}$. The PIST dynamic range has been further extended using the time-over-threshold (ToT) technique, which can cover the SiPM response spanning from $\mathrm{\sim 900~p.e.}$ to $~\mathrm{\sim 40000~p.e.}$.

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