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arXiv 1707.00871cond-mat.mtrl-sci
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化学气相沉积法一步生长GaN/SiO2核/壳纳米线

One step growth of GaN/SiO2 core/shell nanowire in vapor-liquid-solid route by chemical vapor deposition technique

B. K. Barick, Shivesh Yadav, S. Dhar

摘要:

采用酞菁钴催化剂辅助气-液-固法生长GAN/SiO2核/壳纳米线,以镀有镓铟混合物的硅片为Ga和Si源,以氨为氮和氢的前驱体。镓在铟和氨分解产生的氢的存在下,在约910摄氏度的生长温度下形成Si-Ga-In合金。该合金充当Si、Ga和In的源。使用各种表征工具的详细研究表明,这些线,这是几十微米长,具有范围从20至50 nm的芯的直径分布,而无定形SiO2壳层的厚度约为10 nm。这些金属丝沿着方向生长.还观察到,这些线的平均宽度减小,而它们的密度随着Ga-In混合物中镓比例的增加而增加。

英文摘要:

GaN/SiO2 core/shell nanowires are grown by cobalt phthalocyanine catalyst assisted vapor-liquid-solid route, in which Si wafer coated with a mixture of gallium and indium is used as the source for Ga and Si and ammonia is used as the precursor for nitrogen and hydrogen. Gallium in the presence of indium and hydrogen, which results from the dissociation of ammonia, forms Si-Ga-In alloy at the growth temperature around 910 degree Celsius. This alloy acts as the source of Si, Ga and In. A detailed study using a variety of characterization tools reveals that these wires, which are several tens of micron long, has a diameter distribution of the core ranging from 20 to 50 nm, while the thickness of the amorphous SiO2 shell layer is about 10 nm. These wires grow along direction. It has also been observed that the average width of these wires decreases, while their density increases as the gallium proportion in the Ga-In mixture is increased.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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