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arXiv 1606.03264cond-mat.mes-hall
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以射频应用为目标的石墨烯基场效应晶体管中的短沟道效应

Short channel effects in graphene-based field effect transistors targeting radio-frequency applications

Pedro C. Feijoo, David Jiménez, Xavier Cartoixà

摘要:

石墨烯场效应晶体管(GFET)中的沟道长度缩放是在刚性和柔性衬底两者的射频电子器件中追求更高性能的关键。虽然二维(2D)材料比块体材料提供了更好的抗短沟道效应(SCE)的能力,但它们可以在缩放的GFET中占主导地位。在这项工作中,我们已经开发了一个模型,计算电子和空穴传输沿石墨烯通道的漂移扩散的基础上,同时考虑二维静电。我们的模型得到的二维泊松方程耦合到电流连续性方程的自洽的解决方案,后者嵌入一个适当的模型漂移速度饱和。我们研究了静电和速度饱和在短沟道长度L的GFET中所起的作用。严重的缩放导致GFET输出电导的高度退化。非本征截止频率遵循1/L^n比例趋势,其中指数n满足n < 2。n = 2的情况对应于具有低源极/漏极串联电阻的长沟道GFET,即,沟道电阻控制漏极电流的器件。对于高串联电阻,n降低到n= 1,并且由于SCE,其降低到n < 1的值,特别是在高漏极偏置下。该模型预测高的最大振荡频率高于1太赫兹的沟道长度低于100纳米,但是,为了获得这些频率,它是非常重要的,以尽量减少栅极串联电阻。该模型显示出非常好的协议与实验电流-电压曲线从短沟道GFET,也再现负微分电阻,这是由于扩散电流的减少。

英文摘要:

Channel length scaling in graphene field effect transistors (GFETs) is key in the pursuit of higher performance in radio frequency electronics for both rigid and flexible substrates. Although two-dimensional (2D) materials provide a superior immunity to Short Channel Effects (SCEs) than bulk materials, they could dominate in scaled GFETs. In this work, we have developed a model that calculates electron and hole transport along the graphene channel in a drift-diffusion basis, while considering the 2D electrostatics. Our model obtains the self-consistent solution of the 2D Poisson's equation coupled to the current continuity equation, the latter embedding an appropriate model for drift velocity saturation. We have studied the role played by the electrostatics and the velocity saturation in GFETs with short channel lengths L. Severe scaling results in a high degradation of GFET output conductance. The extrinsic cutoff frequency follows a 1/L^n scaling trend, where the index n fulfills n < 2. The case n = 2 corresponds to long-channel GFETs with low source/drain series resistance, that is, devices where the channel resistance is controlling the drain current. For high series resistance, n decreases down to n= 1, and it degrades to values of n < 1 because of the SCEs, especially at high drain bias. The model predicts high maximum oscillation frequencies above 1 THz for channel lengths below 100 nm, but, in order to obtain these frequencies, it is very important to minimize the gate series resistance. The model shows very good agreement with experimental current voltage curves obtained from short channel GFETs and also reproduces negative differential resistance, which is due to a reduction of diffusion current.

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