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arXiv 1102.2348cond-mat.mes-hall
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石墨烯场效应晶体管:扩散漂移理论

Graphene Field Effect Transistors: Diffusion-Drift Theory

Gennady I. Zebrev

摘要:

基于石墨烯FET沟道电流连续性方程的显式解,建立了载流子输运的半经典扩散漂移描述和I-V特性模型。还描述了石墨烯和绝缘层之间的界面附近或界面处的可再充电缺陷(界面陷阱)的作用。

英文摘要:

Based on explicit solution of current continuity equation in the graphene FET's channel the semi-classical diffusion-drift description of the carrier transport and I-V characteristics model has been developed. Role of rechargeable defects (interface traps) near or at the interface between graphene and insulated layers has also described.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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