arXivDaily arXiv每日学术速递 周一至周五更新
arXiv周末暂无论文更新,休息一下吧,周末愉快~~
arXiv 1509.01445cond-mat.mes-hallcond-mat.mtrl-sci
收藏

二维过渡金属二硫属化合物MX $_2$(M = Mo,W; X = S,Se,Te)原子尺度缺陷的结构、电子和光学性质的系统研究

A systematic study of structural, electronic and optical properties of atomic scale defects in 2D transition metal dichalcogenides MX$_2$ (M = Mo,W; X = S, Se, Te)

Soumyajyoti Haldar, Hakkim Vovusha, Manoj Kumar Yadav, Olle Eriksson, Biplab Sanyal

摘要:

本文采用密度泛函理论系统地研究了二维过渡金属二硫属化合物MX $_2$(M = Mo和W; X = S,Se和Te)中原子尺度缺陷的结构、电子和磁性。各种类型的缺陷,例如,考虑了X空位、X间隙、M空位、M间隙、MX和XX双空位。结果表明,在富X条件下,X间隙原子的形成能最低($\sim$ 1 eV),而在富M条件下,X空位的形成能最低(\ce{MTe2}除外).这两种缺陷在文献报道的生长温度(1000 K-1200 K)下具有非常高的平衡缺陷浓度。一对缺陷,例如,两个X空位或一个M和一个X空位倾向于占据最近的可能距离。对于所考虑的任何一种缺陷,都没有发现磁性的痕迹。除了X间隙,所有其他缺陷都有缺陷态出现在带隙中,这会极大地影响原始系统的电子和光学性质。我们计算的光学性质表明,缺陷态引起的光学跃迁在$\sim$ 1.0 eV,这可能是有益的发光器件。我们的系统研究的结果,预计将指导实验纳米工程的缺陷,以实现适当的性能相关的带隙修改和缺陷指纹的表征,通过光学吸收测量。

英文摘要:

In this work, we have systematically studied structural, electronic and magnetic properties of atomic scale defects in 2D transition metal dichalcogenides MX$_2$, (M = Mo and W; X = S, Se and Te) by density functional theory. Various types of defects, e.g., X vacancy, X interstitial, M vacancy, M interstitial, MX and XX double vacancies have been considered. It has been found that the X interstitial has the lowest formation energy ($\sim$ 1 eV) for all the systems in the X--rich condition whereas for M--rich condition, X vacancy has the lowest formation energy except for \ce{MTe2} systems. Both these defects have very high equilibrium defect concentrations at growth temperatures (1000K-1200K) reported in literature. A pair of defects, e.g., two X vacancies or one M and one X vacancies tend to occupy the nearest possible distance. No trace of magnetism has been found for any one of the defects considered. Apart from X interstitial, all other defects have defect states appearing in the band gap, which can greatly affect the electronic and optical properties of the pristine systems. Our calculated optical properties show that the defect states cause optical transitions at $\sim$ 1.0 eV, which can be beneficial for light emitting devices. The results of our systematic study are expected to guide the experimental nanoengineering of defects to achieve suitable properties related to band gap modifications and characterization of defect fingerprints via optical absorption measurements.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑