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arXiv 1003.2602cond-mat.mes-hall
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原子级薄二硫属化合物晶体的光学鉴定

Optical identification of atomically thin dichalcogenide crystals

Andres Castellanos-Gomez, Nicolas Agraït, Gabino Rubio-Bollinger

摘要:

我们提出了一个系统的研究的光学对比度的二硒化物(NbSe2)和二硫化钼(MoS2)的薄片沉积到Si晶片上的热生长的SiO2层。我们测量薄片的光学对比度,其厚度范围从200层到单层,使用不同的照明波长在可见光谱。这些薄晶体的折射率已获得从测量的光学对比度依赖于薄片厚度通过使用一个简单的模型的基础上的菲涅耳定律。通过这些NbSe 2和MoS2微晶的折射率,可以定量分析光学显微镜数据,以快速和非破坏性的方式确定薄片的厚度。

英文摘要:

We present a systematic study of the optical contrast of diselenide (NbSe2) and molybdenum disulphide (MoS2) flakes deposited onto Si wafers with a thermally grown SiO2 layer. We measure the optical contrast of flakes whose thickness ranges from 200 layers down to a monolayer using different illumination wavelengths in the visible spectrum. The refractive index of these thin crystals has been obtained from the measured optical contrast dependence on the flake thickness by using a simple model based on the Fresnel law. With the refractive index of these NbSe2 and MoS2 crystallites, the optical microscopy data can be quantitatively analyzed to determine the thickness of the flakes in a fast and non-destructive way.

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