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arXiv 1408.6478cond-mat.mes-hallcond-mat.str-el
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铁电单电子晶体管的记忆效应:栅电压电导周期性的破坏

Memory effect in ferroelectric single electron transistor: violation of conductance periodicity in the gate voltage

S. A. Fedorov, A. E. Korolkov, N. M. Chtchelkatchev, O. G. Udalov, I. S. Beloborodov

摘要:

大多数在岛上具有准连续准粒子谱的单电子器件的基本性质是它们的输运特性在栅电压下的周期性。即使相对于将铁电绝缘体放置在源极和漏极隧道结中,该性质也是稳健的。我们发现,将铁电体内部的栅极电容打破这种周期性。这种SET的电流-电压特性强烈地依赖于铁电极化,并且即使对于可以忽略的铁电滞后也显示出巨大的记忆效应,使得这种器件有希望用于记忆应用。

英文摘要:

The fundamental property of most single-electron devices with quasicontinuous quasiparticle spectrum on the island is the periodicity of their transport characteristics in the gate voltage. This property is robust even with respect to placing the ferroelectric insulators in the source and drain tunnel junctions. We show that placing the ferroelectric inside the gate capacitance breaks this periodicity. The current-voltage characteristics of this SET strongly depends on the ferroelectric polarization and shows the giant memory-effect even for negligible ferroelectric hysteresis making this device promising for memory applications.

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