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arXiv 1311.7624cond-mat.mes-hall
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从表面点缺陷周围的STM图像获得费米面轮廓

Fermi surface contours obtained from STM images around surface point defects

N. V. Khotkevych-Sanina, Yu. A. Kolesnichenko, J. M. van Ruitenbeek

摘要:

我们提出了一个理论分析的驻波图案的STM图像,它发生在表面点缺陷。我们考虑任意色散关系的表面状态和计算电导的系统包含一个小尺寸的隧道接触和表面杂质。我们发现严格的理论关系之间的干涉图案在真实空间的STM图像,其傅里叶变换和费米轮廓的二维电子。我们提出了一种新的方法重建费米轮廓的表面电子态,直接从孤立的表面缺陷周围的实空间STM图像。

英文摘要:

We present a theoretical analysis of the standing wave patterns in STM images, which occur around surface point defects. We consider arbitrary dispersion relations for the surface states and calculate the conductance for a system containing a small-size tunnel contact and a surface impurity. We find rigorous theoretical relations between the interference patterns in the real-space STM images, their Fourier transforms and the Fermi contours of two-dimensional electrons. We propose a new method for reconstructing Fermi contours of surface electron states, directly from the real-space STM images around isolated surface defects.

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