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arXiv 1306.3347cond-mat.mes-hall
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基于应变高迁移率HgTe薄膜的三维拓扑绝缘体的输运性质

Transport properties of a 3D topological insulator based on a strained high mobility HgTe film

D. A. Kozlov, Z. D. Kvon, D. Weiss, E. B. Olshanetsky, N. N. Mikhailov, S. A. Dvoretsky

摘要:

我们研究了应变的,80 nm厚的HgTe层的磁输运特性,其具有高迁移率μ = 4 × 10^5 cm ^2/Vs。通过顶栅,费米能从价带通过狄拉克型表面态调谐到导带。磁输运测量允许解开导带电子,空穴和狄拉克电子的电导率的不同贡献。这些结果与应变碲化汞是一种拓扑绝缘体,体带隙约为15 meV,表面态为无带隙的结论是一致的。

英文摘要:

We investigated the magnetotransport properties of strained, 80nm thick HgTe layers featuring a high mobility of mu =4x10^5 cm^2/Vs. By means of a top gate the Fermi-energy is tuned from the valence band through the Dirac type surface states into the conduction band. Magnetotransport measurements allow to disentangle the different contributions of conduction band electrons, holes and Dirac electrons to the conductivity. The results are are in line with previous claims that strained HgTe is a topological insulator with a bulk gap of ~15meV and gapless surface states.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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