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arXiv 1305.3597cond-mat.mes-hall
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H-Si(100)2x 1表面硅原子量子点的单电子动力学

Single Electron Dynamics of an Atomic Silicon Quantum Dot on the H-Si(100) 2x1 Surface

Marco Taucer, Lucian Livadaru, Paul G. Piva, Roshan Achal, Hatem Labidi, Jason L. Pitters, Robert A. Wolkow

摘要:

本文报道了在H-Si(100)2x 1表面上直接观察到的单原子悬挂键(DB)的单电子带电现象。扫描隧道显微镜的尖端被放置在DB附近,作为单个电子敏感电荷检测器。三个不同的悬挂键,正,中性和负的电荷状态,被辨别出来。从数据中提取电荷状态概率,并分析电流轨迹揭示了特征单电子充电动力学。填充率被发现呈指数衰减与增加尖端DB分离,但不是一个函数的样品偏置,而排空率显示一个非常弱的依赖于尖端位置,但强烈依赖于样品偏置,与原子量子点隧道耦合到尖端的一侧和体硅的另一侧的概念一致。

英文摘要:

Here we report the direct observation of single electron charging of a single atomic Dangling Bond (DB) on the H-Si(100) 2x1 surface. The tip of a scanning tunneling microscope is placed adjacent to the DB to serve as a single electron sensitive charge-detector. Three distinct charge states of the dangling bond, positive, neutral, and negative, are discerned. Charge state probabilities are extracted from the data, and analysis of current traces reveals the characteristic single electron charging dynamics. Filling rates are found to decay exponentially with increasing tip-DB separation, but are not a function of sample bias, while emptying rates show a very weak dependence on tip position, but a strong dependence on sample bias, consistent with the notion of an atomic quantum dot tunnel coupled to the tip on one side and the bulk silicon on the other.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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