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arXiv 0909.2857cond-mat.mes-hall
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硅MOS基量子点中单电子自旋弛豫时间的测量

Measurement of the Spin Relaxation Time of Single Electrons in a Silicon MOS-Based Quantum Dot

M. Xiao, M. G. House, H. W. Jiang

摘要:

我们报告的测量的自旋弛豫时间T1的个别电子自旋的Si/SiO2-基量子点(QD)的少电子制度。量子点的能量光谱已经使用电荷传感技术进行。自旋弛豫时间随后测量在时域中的泵浦和探测方法。对于含有未成对自旋的量子点,可能只有一个电子,我们发现T1强烈依赖于所施加的磁场。可能的机制导致所观察到的自旋弛豫进行了讨论。

英文摘要:

We report on measurements of the spin relaxation time T1 of individual electron spins in the few electron regime of a Si/SiO2-based quantum dot (QD). Energy-spectroscopy of the QD has been performed using a charge sensing technique. The spin relaxation times are subsequently measured in the time-domain by a pump-and-probe method. For the QD that contains an unpaired spin, likely only a single electron, we find that T1 depends strongly on the applied magnetic field. Possible mechanisms leading to the observed spin relaxation are discussed.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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