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arXiv 1304.7680cond-mat.mtrl-sci
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表面中心对硅太阳电池有效表面复合率及参数的影响

Influence of surface centers on the effective surface recombination rate and the parameters of silicon solar cells

V. P. Kostylyov, A. V. Sachenko, I. O. Sokolovskyi, V. V. Chernenko, T. V. Slusar, A. V. Sushyi

摘要:

报道了指数分布表面中心对硅太阳电池有效表面复合率和参数影响的研究结果。在我们的计算中,我们假设受体和施主表面态分别位于带隙的上部和下部。该模型还假设在能隙中间存在一个离散的表面能级。在连续分布中心的积分浓度与深表面能级的积分浓度相当的情况下,这些中心只能由于复合而影响SC参数。如果连续分布的中心的浓度与表征绝缘体中内置电荷的浓度相当或更高,则这些中心直接影响表面能带弯曲和光生电动势。借助于计算机模拟,确定了通过连续分布的表面中心的表面复合速率超过通过深离散能级的表面复合速率的条件。计算了与通过连续分布中心的复合相关联的反相硅SC中的开路电压的降低。所得的理论结果与实验数据进行了比较。

英文摘要:

The results of our researches of the influence of exponentially distributed surface centers on the effective surface recombination rate and the parameters of silicon solar cells (SCs) are reported. In our calculations, we assumed the acceptor and donor surface states to lie in the upper and lower, respectively, parts of the bandgap. The model also supposed a discrete surface level to exist in the middle of the energy gap. In the case where the integrated concentration of continuously distributed centers is comparable with that of deep surface levels, those centers can affect the SC parameters only due to the recombination. If the concentration of continuously distributed centers is comparable or higher than the concentration characterizing a charge built-in into the insulator, those centers directly affect the surface band bending and the photo-induced electromotive force. With the help of a computer simulation, the conditions for the rate of surface recombination through continuously distributed surface centers to exceed that through the deep discrete level are determined. A decrease of the open-circuit voltage in inverted silicon SCs associated with the recombination through continuously distributed centers is calculated. The obtained theoretical results are compared with the experimental data.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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