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arXiv 1301.4929cond-mat.mtrl-sci
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用石墨烯探测快重离子辐照效应

Detecting swift heavy ion irradiation effects with graphene

O. Ochedowski, S. Akcöltekin, B. Ban d`Etat, H. Lebius, M. Schleberger

摘要:

在本文中,我们展示了如何利用单层石墨烯研究快速重离子(SHI)在各种衬底上的修饰。通过将块状石墨分别机械剥离到SrTiO $_3$、NaCl和Si(111)上制备样品。SHI辐照下进行掠射角的入射和样品进行了分析,通过原子力显微镜在环境条件下。我们表明,石墨烯可以用来检查是否是成功的照射或不,以确定标称离子注量和局部标记SHI的影响。对于原位制备的样品,石墨烯被证明能够捕获原本会从表面逸出的材料。

英文摘要:

In this paper we show how single layer graphene can be utilized to study swift heavy ion (SHI) modifications on various substrates. The samples were prepared by mechanical exfoliation of bulk graphite onto SrTiO$_3$, NaCl and Si(111), respectively. SHI irradiations were performed under glancing angles of incidence and the samples were analysed by means of atomic force microscopy in ambient conditions. We show that graphene can be used to check whether the irradiation was successful or not, to determine the nominal ion fluence and to locally mark SHI impacts. In case of samples prepared in situ, graphene is shown to be able to catch material which would otherwise escape from the surface.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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