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arXiv 1209.2840cond-mat.mes-hallcond-mat.mtrl-scicond-mat.str-el
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(Bi1-xInx)_2Se_3薄膜的拓扑金属-带绝缘体转变

Topological-Metal to Band-Insulator Transition in (Bi1-xInx)2Se3 Thin Films

Matthew Brahlek, Namrata Bansal, Nikesh Koirala, Su-Yang Xu, Madhab Neupane, Chang Liu, M. Zahid Hasan, Seongshik Oh

摘要:

通过对(Bi_(1-x)In_x)_2Se_3薄膜的输运和光电子发射测量,我们报道了该系统通过三个量子相变从拓扑非平凡金属转变为拓扑平凡带绝缘体.在x = 3- 7%时,存在从拓扑非平凡金属到平凡金属的过渡。在x = 15%时,金属变成可变范围跳跃绝缘体。最后,在x = 25%以上,系统变成真正的带状绝缘体,其电阻甚至在室温下也不可测量地大。这种材料提供了一个新的场所,研究拓扑可调的物理和无缝门控/隧穿绝缘体的设备。

英文摘要:

By combining transport and photo emission measurements on (Bi1-xInx)2Se3 thin films, we report that this system transforms from a topologically non-trivial metal into a topologically trivial band insulator through three quantum phase transitions. At x = 3-7%, there is a transition from a topologically non-trivial metal to a trivial metal. At x = 15%, the metal becomes a variable-range-hopping insulator. Finally, above x = 25%, the system becomes a true band insulator with its resistance immeasurably large even at room temperature. This material provides a new venue to investigate topologically tunable physics and devices with seamless gating/tunneling insulators.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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